New Testing Instrument For Compact Embedded Designs


  • Maximum Flexibility when Testing Electronic Assemblies with new Test Fixture Y-ETI .
  • The contacting of highly complex and tiny sub assemblies is increasingly becoming a challenge.
New test fiixture
New test fixture

Yamaichi Electronics, a German company for Electronic Instruments has released a new product in the test fixture industry. Y-ETI is designed to improve fabrication of low-signal-quality applications for high performance embedded systems.

A test fixture is a device which is used in the testing of designed electronic circuits without creating an external contact with the hardware to be tested. It generally creates a fixture in which the electronic designed board is placed and is contacted with some removable pins. These pins help to measure and analyse the circuit design without soldering any external hardware to the designed circuit.

The embedded devices are designed in very small sizes to increase the portability of the device. Such hardware cannot always be completely tested without external contacting, and one must resort to high-precision contact units.


The Y-ETI provides the user with many new options for contacting and testing electrical assemblies. The modularity and flexibility of the design help in doing all the operations in a single test fixture.

Some of the Features of Y-ETI first version are –

  • The dimensions for the machine is 566 mm x 463 mm x 197 mm.
  • The size of the DUT work surface is 270mm x 270 mm.
  • Total Signal processing speed goes up to 12.5 Gbps and a maximum of 1020 connections can be used.
  • It comes integrated with a TAB(Test application board ) which ensures signal runtime adjustment and necessary impedance.

The main components of the test fixture consist of the basic box, the contact units and the extension box. The novel lever mechanism enables the simple operation and horizontal or parallel contacting of the test sample, regardless of whether it has to be contacted only from one side or from the top and bottom in the sandwich method.

TI's Power IC With EMI-Optimised Integrated Transformer Technology

The connection to the respective test system environment is established through the extension box, which is docked to the back of the adapter through standard nylon interface blocks with 6 x 170 pins footprint. In contrast to most conventional test adapters, the extension box has the advantage that the Y-ETI is not bound to a test system.

The basic adapter remains the same by selecting the possible contact unit – either through a cassette or the Test Application Board (TAB) – the smallest possible test pitch is selected. As a rule, in case of assemblies with a larger test pitch and uncritical signals, conventional cassette is used. The signal wiring is done using standard ICT pins and a wire-wrap cable routing terminating on the back of the cassette on the standard 170-pin pylon interface blocks.

For applications with higher signal quality and Fine Pitch requirements, the Test Application Board (TAB) replaces the removable cassette. By using up to 0.2mm thin spring contacts, which are integrated into high-performance plastics, structures up to 0.25 mm test pad spacing can be realised.

The instrument will provide higher accuracies and precision in terms of testing and optimising the manufacturing of small size embedded systems.

For more information click here.




Please enter your comment!
Please enter your name here

Are you human? *